FT/IR-4100 Fourier Transform Infrared Spectrometer
Overview
The Jasco FT/IR-4100 is a high-performance Fourier Transform Infrared Spectrometer designed for reliable qualitative and quantitative analysis across various laboratory environments. This model features a corner-cube mirror interferometer and a highly sensitive DLATGS detector to ensure exceptional signal-to-noise ratios and long-term optical stability.
Highlights
- Self-aligning corner-cube mirror interferometer provides high optical stability and consistent throughput.
- Auto-alignment function ensures optimal optical bench performance and ease of maintenance.
- Expandable spectral range and integrated sealed interferometer for protection against humidity.
- High-intensity ceramic light source and high-sensitivity DLATGS detector for precise spectral data acquisition.
At-a-glance
- Model/Variant
- FT/IR-4100
- Unique Model Features
- Corner-cube mirror interferometer, automatic alignment, and sealed interferometer housing.
- Capabilities
- Spectral range 7,800 to 350 cm-1; Maximum resolution 0.9 cm-1; Signal-to-noise ratio 25,000:1.
- Recommended Applications
- Material identification, quality control, pharmaceutical analysis, and chemical research.
- Condition
- Surplus/second-hand; stored under manufacturer-recommended conditions.
Applications
This spectrometer is utilized in laboratories for identifying unknown organic compounds and verifying raw material purity. It is suitable for applications involving thin film characterization, environmental monitoring, and investigating molecular structures through mid-infrared spectroscopy.
Sustainability
By rehoming surplus lab products, this listing supports waste reduction and resource efficiency.
Responsible use & safety
- Require training/authorization before use.
- Inspect before operation; do not use if safety features are compromised.
- Follow manufacturer's manual for operation and maintenance.
- Equipment-specific guidance: Ensure proper ventilation, monitor desiccant status within the optical bench, and verify alignment before critical measurements.
